Abstract
There has recently been a great deal of interest in the direct measurement of atomic spectral line profiles from sources which are commonly used in atomic absorption (AAS) and atomic fluorescence spectrometry (AFS), e.g., hollow cathode lamps (HCLs), electrodeless discharge lamps (EDLs), and vapor discharge lamps (VDLs). Knowledge of spectral line profiles is of great importance in theoretical AAS and AFS studies.
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