Abstract
In this paper, the author briefly revises the application of the spectral domain approach (SDA) to the analysis of multiconductor planar structures embedded in multilayered, anisotropic and lossy substrates. By using his own experience, the author provides several advices concerning the numerical computation of the spectral Green's function, concerning the choice of basis functions in the spatial domain for the unknown field sources (current densities, charge densities, ...), and concerning the numerical evaluation of the infinite series and integrals which have to be computed when applying the SDA. Some results are presented for the characteristic parameters of planar transmission lines (microstrips, coplanar waveguides, striplines), microstrip discontinuities and microstrip resonators. These results, which have been obtained by using the SDA, are provided as examples of the application of this numerical technique to the characterization of planar structures embedded in multilayered, anisotropic and lossy substrates.
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