Abstract
Spectral computed tomography (CT) or dual-energy CT (DECT) is an advanced form of CT with increasing applications in head and neck radiology. This article provides an overview of the DECT technique and reviews current applications for the evaluation of neck pathology, focusing on oncologic applications. Included are an overview of the basic underlying principles and approaches for DECT scan acquisition and material characterization; a discussion of various DECT reconstructions and a brief overview of practical issues pertaining to DECT implementation, including those related to workflow impact of DECT; and a discussion of various applications of DECT for the evaluation of the neck, especially in oncology.
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