Abstract
The data presented in this article is related to the research experiment, titled: ‘Quasi in-situ energy dispersive X-ray spectroscopy observation of matrix and solute interactions on Y-Ti-O oxide particles in an austenitic stainless steel under 1MeV Kr2+ high temperature irradiation’ (Brooks et al., 2017) [1]. Quasi in-situ analysis during 1MeV Kr2+ 520°C irradiation allowed the same microstructural area to be observed using a transmission electron microscope (TEM), on an oxide dispersion strengthened (ODS) austenitic stainless steel sample. The data presented contains two sets of energy dispersive X-ray spectroscopy (EDX) data collected before and after irradiation to 1.5 displacements-per-atom (~1.25×10−3dpa/s with 7.5×1014ionscm−2). The vendor software used to process and output the data is the Bruker Esprit v1.9 suite. The data includes the spectral (counts vs. keV energy) of the quasi in-situ scanned region (512×512 pixels at 56k magnification), along with the EDX scanning parameters. The.raw files from the Bruker Esprit v1.9 output are additionally included along with the.rpl data information files. Furthermore included are the two quasi in-situ HAADF images for visual comparison of the regions before and after irradiation. This in-situ experiment is deemed ‘quasi’ due to the thin foil irradiation taking place at an external TEM facility. We present this data for critical and/or extended analysis from the scientific community, with applications applying to: experimental data correlation, confirmation of results, and as computer based modeling inputs.
Highlights
The data presented in this article is related to the research experiment, titled: ‘Quasi in-situ energy dispersive X-ray spectroscopy observation of matrix and solute interactions on Y-Ti-O oxide particles in an austenitic stainless steel under 1 MeV Kr2 þ high temperature irradiation’ (Brooks et al, 2017) [1]
Yao / Data in Brief 14 (2017) 707–712. We present this data for critical and/or extended analysis from the scientific community, with applications applying to: experimental data correlation, confirmation of results, and as computer based modeling inputs
Data collection from Queen's University Reactor Materials Testing Laboratory (RMTL): 136 Grant Timmins Dr, Kingston, ON K7M 8N3, Canada Files can be accessed in the Open Science Framework [2]: www.osf.io/5ezcb DOI:10.17605/OSF.IO/5EZCB
Summary
The EDX mapping hardware has four windowless Super-X SDD detectors. Scanning line dwell time was set at 5 μs for a 512×512 pixel frame, with an average detector saturation dead time of 30–40%, depending on the area and magnification. The software used to process the EDX data and output the .txt and .raw files is the Bruker Esprit suite v1.9. General processing settings for element identification and quantification is based off the Φ(ρz) (Phi-Rho-Z) with standards curves, which permits simultaneous absorption and matrix-based atomic number corrections to be made. This involves measuring the intensities of the X-ray lines in the unknown scanned region, pixel by pixel, and comparing those same lines to suitable. Each .txt file in [2] has the EDX settings for the before and after irradiation case
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