Abstract
We present a speckle pattern interferometer for out-of-plane ESPI deformation measurements with a very simple optical setup of Fizeau type. A speckled reference wave is generated by means of a spherically curved transmitting / reflective scattering element placed directly in front of the object. It is slightly roughened and diffusely scatters the divergent beam of a semiconductor laser into the objective lens of the video camera which simultaneously receives the object wave. The transmitting / reflective scattering element is the only optical component needed, thus the device is inexpensive and very easy to align and to operate. The reference wave intensity easily can be matched to that of the object wave. As the common path configuration ensures minimum sensitivity to environmental vibration and air turbulences, this device is very well suited for industrial nondestructive testing.
Published Version
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