Specimen preparation methods

Abstract

Specimen preparation ranges from direct and simple methods to complex, time consuming and even frustrating ones. Fortunately, there are a number of simple methods which are quite adequate for some materials. For example, many particulate materials may be handled by the simple methods. This section covers a wide range of these more simple and generally direct methods which are described in broad subsections: optical microscopy, scanning electron microscopy (SEM) and transmission electron microscopy (TEM) preparations. It must be emphasized that quick observation of most materials by a combination of a simple microscopy technique and direct preparation methods is often helpful in shedding light on the problem. This aids determination of the best approach to a solution. In many cases there is no one correct approach, but there may well be approaches that can save time, if they are conducted early in the study. Tradenames of products used in specimen preparation are mentioned in the text and, unless otherwise stated, these are standard materials available from the EM suppliers (Appendix V). Specific microscopes are not mentioned but microscope vendors are listed in Appendix VI.