Abstract
The temperature dependence of forward and reverse branches of the current–voltage characteristic of the semiconductor structure of a photoelectric converter with an n+–p-junction based on single-crystal silicon and an antireflective porous silicon film on the front surface has been studied. The presence of several current flow mechanisms has been revealed. It has been demonstrated that traps that emerge in the process of the formation of the porous silicon film have a considerable effect on the current flow processes in the semiconductor structure under consideration.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
