Specialized probes with nanowhisker structures for high resolution magnetic force microscopy

Abstract

Creation and study of specialized nanowhisker probes with magnetic coating are performed for high-precision imaging of various objects by means of atomic force and magnetic force microscopy. Thin layers of Ni and Co are deposited on the surface of nanowhisker structures to perform visualization of magnetic fields on the sample surface, in particular, structure of pits on a hard disk drive (HDD). It is revealed that probes with nanowhisker structures covered with magnetic coating due to their high aspect ratio demonstrate a higher spatial resolution and contrast of magnetic fields visualization in comparison with standard magnetic probes.