Abstract
Extreme climate events such as frost and drought have great influence on wheat growth and yield. Understanding the effects of frost, drought and compound frost-dry events on wheat growth and yield is of great significance for ensuring national food security. In this study, wheat yield prediction model (SCYMvp) was developed by combining crop growth model (CGM), satellite images and meteorological variables. Wheat yield maps in the Huang-Huai-Hai Plain (HHHP) during 2001–2020 were generated using SCYMvp model. Meanwhile, accumulative frost days (AFD), accumulative dry days (ADD) and accumulative frost-dry days (AFDD) in different growth periods of wheat were calculated, and the effects of frost and drought on wheat yield were quantified by the first difference method and linear mixed model. The results showed that wheat yield increased significantly, while the rising trend was obvious at more than half of the regions. Extreme climate events (ECEs) showed a relatively stable change trend, although the change trend was significant only in a few areas. Compared with frost and drought in the early growth period, ECEs in the middle growth period (spring ECEs) had more negative effects on wheat growth and yield. Wheat yield was negatively correlated with spring ECEs, and yield loss was between 4.6 and 49.8 kg/ha for each 1 d increase of spring ECEs. The effects of spring ECEs on wheat yield were ranked as AFDD > AFD > ADD. The negative effect of ADD on wheat yield in the late growth period was higher than that in the other periods. The negative effects of spring ECEs on yield in southern regions were higher than those in northern regions. Overall, due to the adverse effects of frost and drought on wheat yield in the middle and late growth periods, the mean annual yield loss was 6.4 %, among which spring AFD caused the greatest loss to wheat yield (3.1 %). The results have important guiding significance for formulating climate adaptation management strategies.
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