Abstract
Knowing the temperature distribution within the conducting walls of various multilayer-type materials is crucial for a better understanding of heat-transfer processes. This applies to many engineering fields, good examples being photovoltaics and microelectronics. In this work we present a novel fluorescence technique that makes possible the non-invasive imaging of local temperature distributions within a transparent, temperature-sensitive, co-doped Er:GPF1Yb0.5Er glass-ceramic with micrometer spatial resolution. The thermal imaging was performed with a high-resolution fluorescence microscopy system, measuring different focal planes along the z-axis. This ultimately enabled a precise axial reconstruction of the temperature distribution across a 500-µm-thick glass-ceramic sample. The experimental measurements showed good agreement with computer-modeled heat simulations and suggest that the technique could be adopted for the spatial analyses of local thermal processes within optically transparent materials. For instance, the technique could be used to measure the temperature distribution of intermediate, transparent layers of novel ultra-high-efficiency solar cells at the micron and sub-micron levels.
Highlights
EMCCD data,On after which the data was normalized with the fluorescence-intensity profile the sides of the modeled heated tip and the glass-ceramic sample, weatassumed the initial room temperature measured at different focal planes along the z-axis of the samloss due to the natural, convection-based, air-cooling mode
Todemonstrate demonstrate the the ability ability to to image image the the local localtemperature temperature distribution distribution inside inside the the transparent fluorescent material, a sharp electrically heated tip was applied to generate transparent fluorescent material, a sharp electrically heated tip was applied to generateaa micro-sized
Increasing temperature of the heated promoted the thermal dissipation into the fluorescent sample and decreased tip promoted the thermal dissipation into the fluorescent sample and dethe fluorescence emission’semission’s intensity
Summary
To effectively control the spatial thermal distribution of ever-increasing power densities in novel micro- and nano-electromechanical systems (MEMS/NEMS) and devices, more accurate temperature monitoring is needed [1–3]. Micro-Raman spectroscopy, in particular, is one of the promising techniques that can provide accurate measurements of the local 3D temperature distribution in multilayer heterogeneous structures such as semiconductor devices [19,20]. We describe the development of a fluorescence-based technique that permits non-invasive measurements of the local temperature distribution within a transparent, temperature-sensitive Er:GPF1Yb0.5Er glass-ceramic. This technique could be suited to the characterization of functionalized transparent materials that can tolerate dopant-induced changes, especially in advanced semiconductor devices. By measuring the variations in fluorescence intensity along the vertical scanning path of bulk material, several thermal images were extracted and used for the reconstruction of the axial temperature distribution with a spatial resolution of a few micrometers. To verify the temperature distribution within the sample, a comparison between the experimental results and the simulation results of COMSOL Multiphysics software was performed
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