Abstract
The variation of electronic properties in an amorphous (a)-Si:H solar cell film deposited on a textured substrate is measured with sub-micrometer resolution (<500 nm). The experiments are performed using a high resolution laser beam induced current (LBIC) set-up where in addition to the photocurrent the light reflection is monitored. Fluctuations in photocurrent are correlated with surface structures of the cell. These variations are mainly caused by variations in the light intensity due to the lateral structure and lateral variation of the local electric field in the pin-junction. The results are discussed including resolution limits of the apparatus and atomic force image of the solar cell.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
