Abstract
SUMMARYBuried interfaces have traditionally been inaccessible to direct investigation by surface‐sensitive techniques. A unique and novel electronic probe, which is sensitive to subsurface electronic structure, has been utilized to probe Schottky barrier interfaces. The method, ballistic electron emission microscopy (BEEM), is based on scanning tunnelling microscopy (STM) techniques. A theoretical treatment has been developed to describe the ballistic electron spectra obtained by BEEM and this treatment is applied to data obtained on the Au‐Si Schottky barrier interface system. Excellent agreement between experiment and theory is obtained. In addition, the treatment pradicts nanometre spatial resolution for interface imaging by BEEM.
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