Abstract
Recently we have demonstrated a novel method of extending the cut-off wavelength of InAsSb nBn detectors, by incorporating a series of monolayers of InSb, which we have termed a digital alloy. In recent work we have shown that while increasing temperature from 15 K to 40 K we observe a 14 meV blue shift of the photoluminescence peak energy and a decrease in minority carrier lifetime. We have hypothesized this effect is due to carrier localization caused by macro-scale fluctuations in layer thickness or alloy composition. Here we study the spatial variation of this effect over the surface of a sample, demonstrating significant variation with position. We discuss implications of this for the carrier localization hypothesis.
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