Abstract
The Ni-Si system is one of the few Ni-based binary alloys that shows negative lattice mismatch between the gamma-prime precipitates and the disordered matrix. The precipitates remain coherent and spherical until their size exceeds 80nm. Recent work has demonstrated that the precipitation kinetics shows a clear transition from the growth period to coarsening in accordance with the Lifshitz-Slyozov-Wagner (LSW) theory of Ostwald ripening. Only two previous reports have shown the preferred alignment of precipitates in Ni-Si at high temperatures after long annealling when precipitates are incoherent and nonspherical. The current work has been undertaken to search for the possible presence of nonrandom arrangement of spherical and coherent precipitates at lower temperatures by a combination of high resolution diffraction using synchrotron radiation, small-angle neutron scattering, and transmission electron microscopy techniques. Diffraction methods are chosen because the modulated and arrangement of coherent precipitates is characterized by diffraction side bands (satellites) in the vicinity of the fundamental Bragg peaks including the forwardly diffracted beam.
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