Abstract
SynopsisSimulation of high-intensity x-ray scattering from a crystal that is larger than the transverse x-ray beam profile is presented. We consider a crystal with a size of a micron, when irradiated by an x-ray beam having a focus of 100 nm. We discuss the methodological challenges that had to be overcome in order to calculate the x-ray scattering pattern. Our calculations enable us to identify the characteristic features of the spatial beam profile imprinted in the scattering pattern.
Highlights
Synopsis Simulation of high-intensity x-ray scattering from a crystal that is larger than the transverse x-ray beam profile is presented
Our calculations enable us to identify the characteristic features of the spatial beam profile imprinted in the scattering pattern
That means the changes of scattering form factors [1] and atomic positions are strongly fluence dependent
Summary
Synopsis Simulation of high-intensity x-ray scattering from a crystal that is larger than the transverse x-ray beam profile is presented. We consider a crystal with a size of a micron, when irradiated by an x-ray beam having a focus of 100 nm. We discuss the methodological challenges that had to be overcome in order to calculate the x-ray scattering pattern. Our calculations enable us to identify the characteristic features of the spatial beam profile imprinted in the scattering pattern.
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