Sparsely sampled Fourier ptychography in diffuse reflection

Abstract

Fourier ptychography microscopy combines the idea of aperture synthesis, which enables the synthesis of multiple low-resolution images in the frequency domain to achieve large field-of-view and high-resolution imaging results. The Fourier ptychography imaging technique applied to the field of far-field diffuse reflectance imaging needs to consider the impact of diffuse reflectance speckle formed by the object’s rough surface on the imaging results. Therefore, far-field diffuse reflectance Fourier ptychography often requires more than microscopic imaging of low-resolution images to achieve super-resolution. In response, we design a sparse sampling method that can reduce the number of required low-resolution images to one-fourth of the original sampling, and does not affect the imaging resolution. Experimental results show that our method can significantly improve imaging efficiency and achieve super-resolution far-field imaging with fast sampling.