Abstract
A new technique allowing elemental analysis of small regions of scanning tunneling microscopy (STM) substrates without loss of tip-surface registry has been developed. The technique is based on spark atomic emission spectroscopy and provides information normally unavailable from the STM. In this technique, a voltage excursion (>100 V) is used to excite the sample and cause emission. Spectra from a polished copper electrode surface are presented and discussed. Important parameters and present limitations are also discussed along with future directions for the improvement and long-term use of the technique.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
