Abstract
In this work, an approach for enabling miniaturized, low-voltage hardware for active structural health monitoring (SHM) based on ultrasonic guided waves is investigated. The proposed technique relies on S-parameter measurements instead of time-domain pulsing and thereby trades off longer measurement times with lower actuation voltages for improved compatibility with dense complementary metal-oxide-semiconductor (CMOS) chip integration. To demonstrate the feasibility of this method, we present results showing the successful localization of defects in aluminum and carbon-fiber-reinforced polymer (CFRP) test structures using S-parameter measurements. The S-parameter measurements were made on benchtop vector network analyzers that actuate the piezoelectric transducers at output voltage amplitudes as low as 1.264 Vpp.
Highlights
The increased use of high-performance composites and the need to lower maintenance costs while ensuring high standards of safety and reliability are prevailing trends in the aerospace industry
In-situ structural health monitoring (SHM) systems are a key enabler of this condition-based maintenance paradigm because they can test the physical condition of structures in an automated, on-demand, and real-time fashion
A key bottleneck in the deployment of in-situ Ultrasonic guided waves (UGWs) SHM systems is the use of data acquisition electronic systems that are bulky and unsuited for wide scale operation in the aircraft environment, which is highly sensitive to additional weight and volume
Summary
The increased use of high-performance composites and the need to lower maintenance costs while ensuring high standards of safety and reliability are prevailing trends in the aerospace industry. To withstand the large electric fields that are generated by these pulses, ultrasonic SHM systems are typically implemented using standard laboratory equipment [6,7,8] or bulky discrete electronic components [9,10]. S-parameters widely used in electrical engineering to describe the behavior linear, multi-port. S-parametersare are widely used in electrical engineering to describe the of behavior of linear, electrical networks response in to stimulation electrical signals. 1 shows the S-parameter multi-port electricalinnetworks response to by stimulation by electrical signals.
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