Space-resolved extreme ultraviolet spectrometer for impurity diagnostics in HL-2A

Abstract

Abstract A space-resolved extreme ultraviolet (EUV) spectrometer system has been developed in the HL-2A tokamak for impurity monitoring and transport studies. A charge-coupled-device (CCD) detector is mounted on a two-stage wavelength scanning mechanism for measuring the spatial profile of impurity line emissions in the wavelength range of 30−600 A. A good spatial profile of impurity line emissions is observed throughout the lower half of the HL-2A plasma along the vertical direction by installing a space-resolved slit in front of an entrance slit. The vertical observation range is ∼43 cm covering a wide plasma area from the plasma central region to the vicinity of divertor separatrix X-point. In order to make a critical analysis of the impurity transport, in particular, in the plasma edge, an accurate position calibration in the observed vertical impurity line intensity profile is necessary. For the purpose a thin metal bar is installed at the diagnositc port. Then, the vertical position of the impurity profile can be accurately determined throughout the entire wavelength range. Based on the present method, the local emissivity profile of impurity line emissions is well reconstructed with good accuracy through Abel inversion technique. Resultant CIV and CVI local emissivity profiles show a clear difference in the carbon transport between ohmic and NBI heating phases.