Abstract
Coherent X-ray diffraction (CXD) is a potentially important technique for the study of surfaces and interfaces. The level of coherence achievable in a given situation is a function of both the instrumentation used and the source of X-rays. Coherence can be lost by certain kinds of imperfection within these components. Here, we present some elementary principles for the preservation of coherence in a typical synchrotron radiation beamline. These will be illustrated with results from the Sector 34 CXD beamline at the advanced photon source. The consequences for diffraction imaging of surfaces and interfaces with CXD are also discussed in this paper.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
