Abstract
Radiation-based techniques for measuring electron source sizes are widely used as emittance diagnostics at existing synchrotron sources. Three of these techniques, namely, pinhole imaging, double-slit interferometry, and a K-edge filter-based beam position and size monitor system (ps-BPM), are evaluated for measuring source sizes at low-emittance storage rings. Each technique is reviewed with a detailed system description, design optimization, and practical considerations targeted for small source sizes. Pinhole imaging has the simplest setup and gives the beam profile in both transverse dimensions but with limited resolution. Double-slit interferometry has the highest resolution but with a limited detectable size range. The ps-BPM system shows reasonable resolution for monitoring small source sizes and divergence and can give real-time information of the source position and angle. New facilities may consider an integrated system that combines some or all of these techniques.
Highlights
Accurate measurements of electron source emittance [1] are increasingly gaining attention as new-generation synchrotron sources are being designed and built
Each technique is reviewed with a detailed system description, design optimization, and practical considerations targeted for small source sizes
The image profile recorded on the detector contains contributions from the magnified source image, the point spread function (PSF) of the pinhole, and the PSF of the Published by the American Physical Society
Summary
Accurate measurements of electron source emittance [1] are increasingly gaining attention as new-generation synchrotron sources are being designed and built. These new machines are mostly based on multibend achromat (MBA) lattices [2] to achieve ultrasmall emittance in the pm·rad level [3,4]. The most commonly used methods to measure and monitor the electron source size are pinhole imaging [6,7,8] and double-slit interferometry [9,10,11]. The. double-slit interferometry method is based on the measurement of the transverse coherence of the photon beam and has a high resolution (ability to measure small source sizes). We will focus on the review of these three methods and discuss the general principles, insights on the optimization of each system, their advantages and limitations, and considerations for building practical devices
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