Abstract
AbstractThis paper presents a technique, based on dispersion theory, for the analysis of terahertz reflection spectroscopy data measured using ellipsometric methods. Formulas for the complex reflection coefficient provide simpler equations than those used in conventional ellipsometry for resolving the complex refractive index in the THz spectral range. It is proposed that a reflection coefficient ratio yields information on the surface roughness when probing a surface by THz radiation. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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