Abstract
Reactive d.c. sputtering was used to produce thin oxide films of Pb x Sn 1− x O 2, where x was in the range from 0 to 0.6. The optical transmission and reflection spectra were measured at wavenumbers between 1.3 × 10 4 and 3.5 × 10 4 cm -1. From these data the optical constants, surface roughness and thicknesses of films were derived. The results show that the optical constants depend on the composition of the source material used in sputtering. Measurements of the electron energy losses show that, in addition to the basic phase of Pb x Sn 1− x O 2, the films contain other phases of lead oxides as well as pure lead (for x different from zero).
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