Abstract
An attempt has been made to highlight the applications of Bayesian techniques for estimating the reliability parameters for aerospace-electronic systems. Both the exact form of Bayesian exponential estimation and its normalised form are discussed. A method of quantifying the prior density parameters from the pre-test knowledge, such as reliability prediction etc., is also hinted at. To illustrate the methodology, two practical examples, namely, of (i) a sequencer and (ii) an equipment bay, are given.
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