Abstract
A simple equivalent circuit of the dielectric resonator technique, using for measurement of the surface resistance of the samples of non-standard dimensions, was considered and analyzed. It was shown that the coefficient (the geometry factor) relating the surface resistance of the sample to the quality factor may be different in the cases when the inductive resistance (caused by the external inductance) of the sample exceeds significantly its active resistance and when these resistances are of the same order. It was shown too, that an anomaly in the RS versus T dependence (i.e., a decreasing of the surface resistance with increase of the temperature) is possible in double layer structures with thin superconductor and metal films.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
