Abstract
Until recently x-ray experiments were done mainly in laboratories which had x-ray machines. With radioisotope x-ray sources now readily available, many experiments can now be performed in small universities with a minimum investment in equipment. In this paper such a source is used to excite fluorescent x rays in the 0–30-keV range in various metals. These x rays are studied with a conventional proportional counter and with one of the newly developed lithium-drifted silicon, Si(Li), surface barrier detectors. With this latter device resolutions as good as 450 eV are obtained for some of the x-ray measurements. The interaction of x rays with matter is studied by making half-value thickness measurements on aluminum, cobalt, and nickel, using Co57 and Zn65 sources.
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