Abstract
Thin cermet films containing titanium and titanium oxides have been produced by implanting oxygen ions into thin titanium films. The effects of temperature and strain on the resistance of these films have been studied. Fairly large strain gauge factors (>10) have been measured and the structures are found to exhibit conduction characteristics similar to discontinuous films. It is further shown that at high temperatures (>250°C) the films increase their resistance irreversibly by over an order of magnitude, and this behaviour renders them unsuitable for many strain gauge applications.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
