Some aspects of the resistive-to-normal state transition caused by direct and microwave currents in superconducting thin films with phase slip lines

Abstract

Based on analysis of current-voltage characteristics and imaging of the resistive state of thin-film tin strips using low-temperature laser scanning microscopy (LTLSM), the process of destruction of superconductivity by current and microwave irradiation with the formation and spatial rearrangement of the order parameter phase slip lines, and their transformation into discrete localized normal domains are shown. The prospects of LTLSM are considered from the point of view of the study of the high-frequency properties of superconducting structures and spatial characteristics in the pre-critical state for instrumental applications.