Some aspects of contamination detection, analyses, and control in microcircuits for the NASA Space Shuttle program : Salvadore V. Caruso. Proc. IEEE 28th Electron. Components Conf., Anaheim, 24–26 April 1978, p. 28

Abstract

The Space Shuttle system is currently one of the National Aeronautics and Space Administration's (NASA) most important and complex programs. A significant number of hybrid microcircuits are being developed and used on the Space Shuttle. Since the Shuttle is a manned vehicle, reliability of the hybrids is flight critical. Loose particle contamination is one of the major causes of failure and reduced operating life for microcircuits. Process controls, surface coatings, and the particle impact noise detection (PIND) test were assessed for control of particle contamination, and the decision was made by NASA to require PIND test for all hybrid circuits. Selected hybrids from the production line of one vendor that had failed the PIND test were analyzed. Results of this program are presented.