Abstract
In a bulk heterojunction photovoltaic device, the morphology of the active layer strongly affects the device performance. By comparing the device performance from P3HT:PCBM solutions that were aged for different times, we notice that aging time has an influence on device power conversion efficiency. We prove the morphological difference in P3HT:PCBM thin films is caused by different aging time, and demonstrate a relationship between the P3HT:PCBM phase behavior and BHJ device performance through UV-Vis absorption spectrum and atomic force microscope.
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