Solid-State Dewetting in Polycrystalline Co Films on Native Oxide Si(100) by Kirkendall Effects

Abstract

ADVERTISEMENT RETURN TO ISSUEPREVArticleNEXTADDITION / CORRECTIONThis article has been corrected. View the notice.Solid-State Dewetting in Polycrystalline Co Films on Native Oxide Si(100) by Kirkendall EffectsYue ZhaoYue ZhaoKey Laboratory of Electromagnetic Processing of Materials (Ministry of Education), Northeastern University, Shenyang 110819, ChinaMore by Yue Zhao, Kai WangKai WangKey Laboratory of Electromagnetic Processing of Materials (Ministry of Education), Northeastern University, Shenyang 110819, ChinaMore by Kai Wang, Shuang YuanShuang YuanDepartment of New Energy Science and Engineering, School of Metallurgy, Northeastern University, Shenyang 110819, ChinaMore by Shuang Yuan, Guojian Li*Guojian LiKey Laboratory of Electromagnetic Processing of Materials (Ministry of Education), Northeastern University, Shenyang 110819, China*E-mail: [email protected]. Tel: +86-24-83685649. Fax: +86-24-83681758.More by Guojian Lihttp://orcid.org/0000-0002-4047-0766, Yonghui MaYonghui MaInstitute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, ChinaMore by Yonghui Ma, and Qiang WangQiang WangKey Laboratory of Electromagnetic Processing of Materials (Ministry of Education), Northeastern University, Shenyang 110819, ChinaMore by Qiang Wanghttp://orcid.org/0000-0002-5748-4232Cite this: J. Phys. Chem. C 2019, 123, 32, 19572–19578Publication Date (Web):July 19, 2019Publication History Received4 May 2019Revised19 July 2019Published online19 July 2019Published inissue 15 August 2019https://doi.org/10.1021/acs.jpcc.9b04226Copyright © 2019 American Chemical SocietyRIGHTS & PERMISSIONSArticle Views377Altmetric-Citations3LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InReddit Read OnlinePDF (5 MB) Get e-AlertsSUBJECTS:Annealing (metallurgy),Oxides,Physical and chemical processes,Thin films,Transmission electron microscopy Get e-Alerts