Abstract
A solvent-free solid-phase technique was developed for the targeted defect passivation of perovskite films, resulting in an ultra-high PCE of 25.2%.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
