Abstract

The solid flexRIXS endstation combines an X-ray emission spectrometer with resolving powers above 1000 with a diffractometer setup for solid sample systems. It is flexible in its use at different beam lines and facilities.

Highlights

  • The solid exRIXS is an endstation for complementary application of RIXS, di raction and absorption measurements both at BESSY II and free-electron lasers

  • The sample stage can be cooled with liquid Helium and in a di erent con guration heated by electron bombardment heating to more than 1000°C

  • Sample drain current can be measured for total electron yield absorption measurements and a photodiode can be used for di raction / resonant scattering experiments as well as uorescence yield detection

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Summary

Introduction

The solid exRIXS is an endstation for complementary application of RIXS, di raction (resonant scattering) and absorption measurements both at BESSY II and free-electron lasers. This endstation is equipped with a two-axis rotatable sample holding manipulator (one axis motorized). The sample stage can be cooled with liquid Helium and in a di erent con guration heated by electron bombardment heating to more than 1000°C.

Results
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