Abstract
In this research we present a Lock-In amplifier photoluminescence image (PLI) detection system. Using a commercially available CCD camera, combined with a modulated excitation light source system, Lock-In amplifier technique is employed to enhance the sensitivity and signal-to-noise ratio of the image. Using a high resolution camera, we developed a high spatial resolution non-contact inspection system for solar cell. Each solar cell can be examined within 2s relevant for inline processing control.
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