Abstract
Double-layer thin films of SiO 2 and TiO 2, applied using the sol-gel process, were utilized as antireflection coatings on silicon solar cells. When coated with these films, the efficiency of a solar cell was increased by 44%, which agrees well with the measured increase in cell solar absorbance of 47%. Modeling of the reflectance properties of the coated cells, using thickness and index of refraction values determined from ellipsometric measurements, was in excellent agreement with the spectral reflectance properties measured from 300 to 1100 nm. Transmission electron microscopy on sectioned samples revealed sharp interfaces between the sol-gel films and thicknesses in good agreement with the ellipsometric values.
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