Soft-Electron Beam and Gamma-Radiation Sensitivity and DNA Damage in Phosphine-Resistant and -Susceptible Strains of Rhyzopertha dominica

Abstract

The soft-electron beam (low-energy electrons) and gamma-radiation sensitivities of phosphine-resistant (PHR) and -susceptible (PHS) strains of adults lesser grain borer Rhyzopertha dominica (F.) were studied, with particular reference to DNA damage assessed using single-cell electrophoresis (comet assay). Results showed that mortality in adult R. dominica varied significantly between both PHR and PHS strains. Adults of the PHR strain were found to be more tolerant toward soft-electron and gamma radiation than adults of the PHS strain. Studies on the longevity of strains showed that mean survival time and dose rate were highly correlated with both strains and treatments. Results also showed that adults of the PHR strain lived longer than adults of PHS strain for both treatments. Radiation sensitivity indices, however, decreased as radiation dose increased in both strains. Analysis of DNA damage, after 40- and 160-Gy gamma radiation, was carried out using cells obtained from both strains. Gamma-irradiated adults of both strains showed typical DNA fragmentation, compared with cells from nonirradiated adults, which showed more intact DNA. Investigations using the comet assay showed that tail length, moment, olive-tail moment, percentage of tail DNA, and percentage of DNA damage were all greater in the PHS strain compared with the PHR strain and the control insects. Results also showed that DNA damage remained at a constant level for up to 24 h after irradiation. The results have been discussed in relation to the observed strain differences in radiation sensitivity and resistance to phosphine.