Abstract
Soft X-ray emission and absorption spectra in the Si L region of a number of substituted polysilanes, (SiR 2) n, have been obtained using synchrotron radiation to investigate their electronic structures. Studied polysilanes were substituted with methyl (R=CH 3), ethyl (C 2H 5), propyl ( n-C 3H 7), butyl ( n-C 4H 9), pentyl ( n-C 5H 11) and phenyl (C 6H 5) groups. Although similar spectral features in both X-ray emission and absorption are observed among alkyl-substituted polysilanes, slight differences are distinguished between alkyl- and phenyl-substituted ones. These spectral features are qualitatively reproduced by summing calculated density-of-state spectra for Si3s- and Si3d-orbitals. Thus, spectral features are explained through the hybridization of electronic orbitals in both backbone Si atoms and substituent C atoms.
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