Abstract
The possibilities and limitations of electron probe microanalysis and scanning electron microscopy at reduced accelerating voltages are summarised. The application of electron probe microanalysis to the analysis of thin coatings in the boron–nitrogen–carbon composition triangle is discussed. Experimental details are given. The potential of modern scanning electron microscopes, operated at low voltages and high magnifications, for materials development and problem solving is illustrated. Examples shown are from fluorocarbon coatings, ultrafiltration membranes, membrane fouling and casings for meat. Experimental details are given.
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