Abstract
Soft X-rays (λ > 1 nm) have escape depths of a few microns or less. Changes in peak profiles, satellite peaks, etc., which can be correlated with chemical effects, can therefore be used to infer chemical changes in sample surfaces. In this paper, hydrolysis and radiation decomposition are both indicated by changes in the boron Kα X-ray emission peak from a variety of boron compounds, (BH 4 −, B(C 6H 5) 4, BN, B 2O 3, BF 4 −). The relationship between X-ray emission and X-ray photoelectron spectra is discussed.
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