Soft X-ray resonant scattering: An element-specific tool to characterize patterned arrays of nanomagnets

Abstract

The authors have demonstrated the use of soft X-ray resonant scattering as an element-specific tool for characterizing the structure and magnetic properties of a rectangular array of nanomagnets. The periodicity and the size of individual elements of an array of Co dots were determined by measuring the intensities of a large number of diffraction orders and comparing them to model calculations performed within the framework of Fraunhoffer diffraction theory. Element-specific hysteresis loops along both the easy and hard axis of the array were measured by tuning the incident energy to the Co L/sub 3/ absorption edge.