Abstract
The surface sensitivity of soft x-ray photoelectron spectroscopy is exploited toprobe the structural, electronic and chemical properties of an organic/inorganicsemiconductor interface. Thin films of tin–phthalocyanine (SnPc) are deposited on aGaAs(001)-1 × 6 surface, prepared by argon ion bombardment. Core level photoemission spectra are analysed tofollow the evolution of the interface with SnPc coverage. The results indicate that the interfaceis largely chemically inert, while the overlayer growth mode is closer to Stranski–Krastanov.Valence spectra show the same molecular features throughout the coverage range. Thevalence band offset and the interface dipole of this heterojunction are 0.45 and−0.37 eV respectively. The interface dipole may have its origin in the difference in electron affinity ofthe organic and inorganic semiconductors.
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