Soft X-ray magnetic scattering as a probe of recording media

Abstract

We highlight recent experiments that use magnetic X-ray scattering as a probe of magnetic recording media. Resonant small-angle scattering at the 2p levels of 3d transition elements strongly enhances scattering from both magnetic and chemical structure of thin films and allows a quantitative determination of the chemical and magnetic grain sizes with nm resolution. The chemical grain size measurements compliments the information determined by transmission electron microscope. However, the ability to measure magnetic correlations in the <100 Å range is well below the resolution that is currently achievable in most magnetic imaging techniques. Information about length scales in non-magnetic underlayers is also provided by these sensitive scattering measurements by tuning the photon energy to elements that are specific to the underlayer structure. These techniques should continue to provide insight and feedback into the development of future recording media.