Abstract
Radiation-induced soft errors are getting worse in digital systems manufactured in advanced technologies. Stringent data integrity and availability requirements of enterprise computing and networking applications demand special attention to soft errors in sequential elements and combinational logic. This tutorial will discuss the impact of technology scaling on soft error rates, circuit-level modeling of soft errors, architectural impact of soft errors, challenges associated with evaluation of run-time behaviors of systems in the presence of soft errors, actual data on system behaviors in the presence of soft errors, metrics for quantifying soft error vulnerabilities, design of architectures with Built-in-Soft-Error-Resilience techniques, and actual case studies.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
