Abstract
The once-ephemeral soft error has recently caused considerable concern for manufacturers of advanced silicon technology as this phenomenon now has the potential for inducing the highest failure rate of all other reliability mechanisms combined. We briefly review the three radiation mechanisms responsible for causing soft errors in commercial electronics and the basic physical mechanism by which ionizing radiation can produce a soft error. We then focus on the soft error sensitivity trends in commercial DRAM, SRAM, and peripheral logic devices as a function of technology scaling and discuss some of the solutions used for mitigating the impact of soft errors in high reliability systems.
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