Abstract
If VLSI RAM densities are to continue to increase, it will undoubtedly be necessary to take the problems associated with much more seriously than has previously been done. In this paper, we propose a methodology for analyzing the effects of soft errors in VLSI RAMS as feature sizes decrease, and for taking corrective action with error-correcting codes. We will take a parametric approach, making several different assumptions about how the error severity will scale as feature size decreases, and our conclusions will be stated relative to the particular assumption made. It is our hope that as more definite information about VLSI error-scaling becomes available, the results of this paper will prove helpful for designers of ultra-dense memories.
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