Abstract
We consider issues related to constructing industrial linear-size monitoring devices using an optoelectronic system (OES) based on National Instruments (NI) smart cameras. A prototype of the experimental setup for measuring the width of a calibrated tunable monochromator slit has been developed. Algorithms have been investigated for measuring linear dimensions in the slit image using the techniques of differentiating the illuminance distribution, determining the best image boundary lines, and locating maxima on the curves of continuous-wavelet-transform (CWT) coefficients. The results of measuring linear dimensions using various algorithms are compared in cases where the image quality is affected by influencing factors. It is shown that the accuracy of linear sizing with a smart camera reaches 0.2 pel (1 μm in the range of 3 mm).
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