Abstract
AbstractScattering by extruded polyethylene films has been used to analyze in detail the small‐angle scattering of x‐rays by strained spherulitic samples. It is shown that the basic small‐angle patterns in spherulitic specimens can be obtained by summing small‐angle reflections from films drawn both parallel and normal to the direction of extrusion. The representation of a complex pattern by superposition of simpler reflection makes it possible to calculate local strains in various regions of spherulites in bulk specimens.
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