Abstract
AbstractSmall‐angle x‐ray scattering studies were made on bulk‐crystallized samples and annealed oriented films of TMPS. The temperature dependence of the small‐angle scattering was determined over a range of annealing conditions. The effect of sample molecular weight on the small‐angle peaks was also studied. The peak intensity, measured at room temperature after annealing, was strongly dependent on the annealing conditions. The position of the peak gradually moved to smaller angles (largerdspacings) as the annealing temperature was raised. Surface free energies were deduced from the melting point dependence of the crystallite size. This surface energy was found to increase with molecular weight in accord with values deduced for spherulite growth rate‐temperature dependence.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
