Abstract
The examination of grazing incidence reflectivity data of X-rays shows a relatively simple empirical relationship between reflectivity, angle of reflection and wavelength, which is valid over more than 2 orders of magnitude of these parameters. It is demonstrated that the reflectivity does not depend on the atomic number, or other constants of the reflector, but depends only on the number of electrons participating in the reflection event. In the neighbourhood of the absorption edges a dispersion effect is shown to exist.
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