Abstract
The xSmTiTaO6 (1-x)YTiNbO6 dielectric ceramic composites were prepared through the solid state ceramic route. The samples were calcined at 1150 oC and sintered in the range 1380-1450 oC. The structural analysis of the materials was done using X-ray diffraction technique. The surface morphology was studied using scanning electron microscopy and the elemental composition of the composite was confirmed using energy dispersive spectrum. The dielectric properties of the samples were measured in the microwave frequency range using cavity resonator method. The dielectric constant at the radio frequency region is also measured. The UV–Visible spectrum was recorded and band gap was calculated. The photoluminescence spectrum of the representative composite was recorded and transitions causing emissions were studied. Most of the samples possess high dielectric constant, high quality factor and low temperature coefficient of resonant frequency, hence suitable for the fabrication of devices in microwave communication. These materials were useful in optoelectronics also since they have strong emission lines in the visible region.
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